Join Chris Loberg of Tektronix as he discusses the challenges design engineers are facing when characterizing high speed serial and optical chips & systems on data rates beyond 10 Gb/s and rise times below 30 picoseconds. By attending this webcast you will learn measurement system methods for addressing these high speed characterization challenges. In highlighting examples, Chris will demonstrate with reference to the next generation of serial data standards including Thunderbolt, PCIe3.0 and high speed optical communications systems beyond 25 Gb/sec like those found in IEEE802.3 specifications.